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) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs.
Michiel Vandemaele
Ben Kaczer
Stanislav Tyaginov
Zlatan Stanojevic
Alexander Makarov
Adrian Chasin
Erik Bury
Hans Mertens
Dimitri Linten
Guido Groeseneken
Published in:
IRPS (2019)
Keyphrases
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data mining
wide range
search space
low dimensional
information systems
training data
trade off
probability distribution
medical images
image quality
modeling method