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) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs.

Michiel VandemaeleBen KaczerStanislav TyaginovZlatan StanojevicAlexander MakarovAdrian ChasinErik BuryHans MertensDimitri LintenGuido Groeseneken
Published in: IRPS (2019)
Keyphrases
  • data mining
  • wide range
  • search space
  • low dimensional
  • information systems
  • training data
  • trade off
  • probability distribution
  • medical images
  • image quality
  • modeling method