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Testing reconfigured RAM's and scrambled address RAM's for pattern sensitive faults.
Manoj Franklin
Kewal K. Saluja
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
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pattern matching
test cases
fault diagnosis
main memory
design considerations
fault model
data sets
machine learning
information retrieval
learning algorithm
database systems
b tree