A hierarchical test generation methodology for digital circuits.

Debashis Bhattacharya John P. Hayes

Published in: J. Electron. Test. (1990)

Keyphrases

digital circuits
test generation
test cases
symbolic execution
test sequences
design automation
data flow
model based diagnosis
static analysis
circuit design
functional decomposition
finite state machines
software testing
quality assurance
code coverage
decision diagrams
data sets
cooperative
metadata