Diagnostic simulation of stuck-at faults in combinational circuits.

Sreejit Chakravarty Yiming Gong

Published in: VTS (1994)

Keyphrases

model based diagnosis
logic circuits
fault detection
data sets
fault isolation
asynchronous circuits
tunnel diode
diagnostic tests
simulation models
simulation model
fault diagnosis
discrete event
mathematical model
diagnostic systems
high speed
expert systems
decision making