Testing Probabilistic Circuits.

Yash Pote Kuldeep S. Meel

Published in: CoRR (2021)

Keyphrases

bayesian networks
test cases
social networks
high speed
data driven
generative model
probability theory
vlsi circuits
artificial intelligence
delay insensitive
asynchronous circuits
test generation
circuit design
software testing
statistical tests
uncertain data
test data
database systems
decision making