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High temperature pulsed-gate robustness testing of SiC power MOSFETs.

Asad FayyazAlberto Castellazzi
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • high temperature
  • silicon dioxide
  • power consumption
  • information systems
  • case study
  • computational efficiency
  • computational power
  • high robustness
  • database
  • test set
  • input output
  • test suite
  • multiple input
  • diesel engine