Don't care filling for power minimization in VLSI circuit testing.
Tapas K. MaitiSantanu ChattopadhyayPublished in: ISCAS (2008)
Keyphrases
- power dissipation
- chip design
- power consumption
- high speed
- vlsi circuits
- low power
- power reduction
- long term
- single phase
- duty cycle
- signal processing
- digital signal processing
- real time
- physical design
- gate array
- data sets
- logic circuits
- test data
- power saving
- analog circuits
- circuit design
- test cases
- objective function
- image processing
- information systems