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3D stacking using ultra thin dies.

Antonio La MannaDimitrios VelenisThibault BuissonMikael DetalleKenneth J. RebibisW. ZhangEric Beyne
Published in: 3DIC (2011)
Keyphrases
  • high speed
  • combining multiple
  • data structure
  • base classifiers
  • ensemble learning
  • database
  • information retrieval
  • multiscale
  • image retrieval
  • test data
  • combining classifiers