COMBINING CLASSIFIERS
Experts
- Robert Sabourin
- Josef Kittler
- Horst Bunke
- Michal Wozniak
- Loris Nanni
- Robert P. W. Duin
- Claudio De Stefano
- Hee-Joong Kang
- Yaxin Bi
- Alessandra Scotto di Freca
- Sotiris B. Kotsiantis
- Gianluigi Folino
- Francesco Fontanella
- Luiz S. Oliveira
- Liangxiao Jiang
- Boguslaw Cyganek
- Anthony J. Bagnall
- Gongde Guo
- María Guijarro
- David A. Bell
- Naohiro Ishii
- Ludmila I. Kuncheva
- Stanislaw Osowski
- Aníbal R. Figueiras-Vidal
- Maria Carolina Monard
- Piotr Jedrzejowicz
- Gonzalo Pajares
- Seppo Puuronen
- Tien Thanh Nguyen
- Lior Rokach
- Alan Wee-Chung Liew
- Alessandra Lumini
- Yijun Chen
- Eulanda Miranda dos Santos
- Mohamed S. Kamel
- Gavin C. Cawley
- Mohamed A. Deriche
- Kevin W. Bowyer
- Michal Kruk
Venues
- CoRR
- Multiple Classifier Systems
- Pattern Recognit.
- ICPR
- MCS
- Expert Syst. Appl.
- IEEE Access
- ICDAR
- Pattern Recognit. Lett.
- IJCNN
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Anal. Appl.
- ICML
- Neurocomputing
- INTERSPEECH
- IGARSS
- Appl. Soft Comput.
- Neural Comput. Appl.
- CIARP
- SMC
- EuroGP
- Inf. Fusion
- ECAI
- KES
- AAAI
- IEEE Trans. Knowl. Data Eng.
- Eng. Appl. Artif. Intell.
- SN Comput. Sci.
- ICTAI
- Inf. Sci.
- Neural Process. Lett.
- Int. J. Pattern Recognit. Artif. Intell.
- Appl. Intell.
- CLEF (Working Notes)
- Int. J. Artif. Intell. Tools
- IEEE Trans. Neural Networks
- FLAIRS Conference
- J. Chem. Inf. Model.
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