Improved Defect Detection Using Novel Wavelet Feature Extraction Involving Principal Component Analysis and Neural Network Techniques.
Dimitris A. KarrasBasil G. MertziosPublished in: Australian Joint Conference on Artificial Intelligence (2002)
Keyphrases
- defect detection
- feature extraction
- principal component analysis
- neural network
- wavelet transform
- pattern recognition
- dimensionality reduction
- dimension reduction
- linear discriminant analysis
- neural classifier
- preprocessing
- face recognition
- discriminant analysis
- face images
- image classification
- independent component analysis
- wavelet neural network
- method based on wavelet
- automated visual inspection
- artificial neural networks
- low dimensional
- feature vectors
- prediction model
- principal components
- pattern classification
- image processing
- feature extraction and classification
- back propagation
- support vector machine svm
- feature space
- textured surfaces
- local binary pattern
- machine learning
- computer vision
- bp neural network
- recurrent neural networks
- neural network model
- singular value decomposition
- covariance matrix
- wavelet coefficients
- hidden layer
- extracted features
- kernel pca
- texture analysis
- kernel principal component analysis
- image coding
- neural network is trained
- self organizing maps