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On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores.

Paolo BernardiMichelangelo GrossoErnesto SánchezMatteo Sonza Reorda
Published in: ETS (2007)
Keyphrases
  • test cases
  • set of test cases
  • automatically generate
  • shortest path
  • fault diagnosis
  • instruction set
  • high speed
  • statistical tests
  • root cause
  • multi core processors