Fault testing for reversible circuits.

Ketan N. Patel John P. Hayes Igor L. Markov

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)

Keyphrases

fault model
high speed
markov chain
fault diagnosis
fault detection
fault models
real time embedded systems
software testing
analog circuits
information retrieval
learning algorithm
multiscale
cellular automata
failure modes
fault injection
fault management