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Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving.

Zhiyuan HeZebo PengPetru ElesPaul M. RosingerBashir M. Al-Hashimi
Published in: DFT (2006)
Keyphrases
  • test set
  • test data
  • test cases
  • error rate
  • training set
  • random selection
  • training data
  • scheduling problem
  • infrared
  • class distribution
  • evaluation methodology
  • database
  • face detector
  • hardware and software
  • round robin