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Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test.
Yves Joannon
Vincent Beroulle
Chantal Robach
Smail Tedjini
Jean-Louis Carbonéro
Published in:
VLSI Design (2008)
Keyphrases
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test set
test data
high level
fault model
test cases
training set
error rate
low level
random selection
training data
class distribution
data sets
evaluation methodology
safety analysis
fault injection
free text
computer vision
database