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Physical degradation of GaN HEMT devices under high drain bias reliability testing.
S. Y. Park
Carlo Floresca
Uttiya Chowdhury
Jose L. Jimenez
Cathy Lee
Edward Beam
Paul Saunier
Tony Balistreri
Moon J. Kim
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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wide range
software reliability
physical world
test cases
high reliability
information retrieval
physical objects
low variance
database
test generation
processing capabilities
early warning
smart phones
embedded systems
test data
hidden markov models
mobile devices
trade off