Carlo Floresca

Publication Activity (10 Years)

Years Active: 2009-2009
Publications (10 Years): 0

Publications

S. Y. Park, Carlo Floresca, Uttiya Chowdhury, Jose L. Jimenez, Cathy Lee, Edward Beam, Paul Saunier, Tony Balistreri, Moon J. Kim
Physical degradation of GaN HEMT devices under high drain bias reliability testing. Microelectron. Reliab. 49 (5) (2009)