Tony Balistreri

Publication Activity (10 Years)

Years Active: 2009-2009
Publications (10 Years): 0

Publications

S. Y. Park, Carlo Floresca, Uttiya Chowdhury, Jose L. Jimenez, Cathy Lee, Edward Beam, Paul Saunier, Tony Balistreri, Moon J. Kim
Physical degradation of GaN HEMT devices under high drain bias reliability testing. Microelectron. Reliab. 49 (5) (2009)
Charles Campbell, Cathy Lee, Victoria Williams, Ming-Yih Kao, Hua-Quen Tserng, Paul Saunier, Tony Balistreri
A Wideband Power Amplifier MMIC Utilizing GaN on SiC HEMT Technology. IEEE J. Solid State Circuits 44 (10) (2009)