IDDQ Testing Method using a Scan Pattern for Production Testing.
Junichi HiraseYoshiyuki GoiYoshiyuki TanakaPublished in: Asian Test Symposium (2005)
Keyphrases
- experimental evaluation
- cost function
- high accuracy
- synthetic data
- preprocessing
- test data
- objective function
- computational complexity
- data sets
- detection method
- clustering method
- production system
- high precision
- support vector machine svm
- computationally efficient
- classification algorithm
- test cases
- segmentation method
- model selection
- matching algorithm
- optimization method
- correlation analysis
- testing phase
- detection algorithm
- classification accuracy
- dynamic programming
- prior knowledge
- video sequences
- multiscale
- similarity measure
- decision trees
- feature selection
- genetic algorithm
- machine learning