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SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement.
Binod Kumar
Masahiro Fujita
Virendra Singh
Published in:
J. Electron. Test. (2019)
Keyphrases
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low cost
answer set programming
image processing
high density
error detection
bounded model checking
image enhancement
transmission line
parallel programming
domain specific
search strategies
sat solvers
partially observable