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Electrical, dielectric and structural characterization of nickel ferrite films for thin film electronic applications.
Stefan Sredojevic
Nikola Kovacevic
Djordje Miseljic
Published in:
EWDTS (2017)
Keyphrases
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thin film
chemical vapor deposition
short circuit
electrical properties
film thickness
silicon nitride
high density
grain size
transmission line
multi layer
electron microscopy
white light interferometry
solar cell
artificial neural networks
single image
room temperature