Exploring the Use of Local Binary Patterns as Focus Measure.
Javier Lorenzo-NavarroModesto Castrillón SantanaJuan MéndezOscar Déniz-SuárezPublished in: CIMCA/IAWTIC/ISE (2008)
Keyphrases
- local binary pattern
- texture classification
- texture analysis
- multiscale
- face recognition
- texture descriptors
- facial expression recognition
- spatial information
- texture features
- illumination invariant
- rotation invariant
- feature extraction
- background subtraction
- feature descriptors
- texture information
- computer vision
- scale and rotation invariant
- similarity measure
- support vector machine
- preprocessing
- feature selection