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Statistical leakage minimization through joint selection of gate sizes, gate lengths and threshold voltage.
Sarvesh Bhardwaj
Yu Cao
Sarma B. K. Vrudhula
Published in:
ASP-DAC (2006)
Keyphrases
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data sets
field effect transistors
nano scale
multiple input
statistical analysis
short circuit
neural network
power system
high density
statistical information
leakage current
machine learning
information systems
markov chain
steady state
selection algorithm