System-level test coverage prediction by structural stress test data mining.

Bing-Yang Lin Cheng-Wen Wu Harry H. Chen

Published in: VLSI-DAT (2015)

Keyphrases

test data
test cases
training data
test set
white box testing
test suite
testing process
prediction accuracy
data sets
training set
databases
search based testing
training samples
software development
evolutionary algorithm
learning algorithm
data mining
database