Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited).
William VandendaeleCamille LeurquinR. LavievilleMarie-Anne JaudAbygaël VieyRomain GwozieckiB. MohamadE. NowakA. ConstantFerdinando IucolanoPublished in: IRPS (2023)
Keyphrases
- power system
- high voltage
- information systems
- highly reliable
- reliability analysis
- transmission line
- invited talk
- threshold selection
- electric field
- failure rate
- electric power systems
- electrical power
- reliability assessment
- data sets
- selected papers
- boundary conditions
- international conference
- artificial intelligence