Fault Detection, Classification, and Location by Static Switch in Microgrids Using Wavelet Transform and Taguchi-Based Artificial Neural Network.
Ying-Yi HongMark Tristan Angelo M. CabatacPublished in: IEEE Syst. J. (2020)
Keyphrases
- fault detection
- wavelet transform
- artificial neural networks
- feature extraction
- pattern recognition
- fault diagnosis
- multiresolution
- industrial processes
- feature vectors
- condition monitoring
- fault localization
- fuel cell
- failure detection
- feature selection
- vibration signal
- subband
- multiscale
- fault identification
- machine learning
- robust fault detection
- multi layer perceptron
- constraint satisfaction problems
- decision support system
- knowledge discovery
- evolutionary algorithm
- search space