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Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set.

Irith Pomeranz
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
  • test set
  • training set
  • error rate
  • training data
  • test data
  • evaluation methodology
  • database
  • learning algorithm
  • feature selection
  • random selection
  • training and test sets