Experimental evaluation of testability measures for test generation (logic circuits).
Susheel J. ChandraJanak H. PatelPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)
Keyphrases
- test generation
- logic circuits
- experimental evaluation
- test data generation
- test cases
- low power
- software testing
- symbolic execution
- test sequences
- design automation
- logic synthesis
- static analysis
- quality assurance
- functional decomposition
- gate array
- tunnel diode
- high speed
- software engineering
- multistage
- software systems
- error rate
- low cost
- high level
- databases
- real time