Performance Evaluation of Probing Front-End Circuits for On-Chip Noise Monitoring.
Yuuki AragaNao UedaYasumasa TakagiMakoto NagataPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2013)
Keyphrases
- analog vlsi
- high speed
- chip design
- circuit design
- signal to noise ratio
- random noise
- monitoring system
- back end
- real time
- noisy data
- power dissipation
- noise level
- additive noise
- noise reduction
- random access memory
- early warning
- cmos technology
- low power
- gaussian noise
- missing data
- low cost
- mixed signal
- analog circuits
- built in self test
- digital circuits
- noise free
- noisy environments
- image noise
- noise model
- high density
- input data