Automated optical inspection system for surface mount device light emitting diodes.
Chung-Feng Jeffrey KuoTz-ying FangChi-Lung LeeHan-Cheng WuPublished in: J. Intell. Manuf. (2019)
Keyphrases
- light emitting diodes
- closely spaced
- three dimensional
- light scattering
- light emitting
- optical properties
- printed circuit boards
- surface defects
- white light
- scanning devices
- white light interferometry
- surface reconstruction
- machine vision
- vision system
- smooth surfaces
- laser scanning
- image processing
- d objects
- surface inspection
- image sequences