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Multiphase BIST: a new reseeding technique for high test-data compression.
Emmanouil Kalligeros
Xrysovalantis Kavousianos
Dimitris Nikolos
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)
Keyphrases
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test data
test set
test cases
training data
training and test data
training set
search based testing
data sets
image compression
pairwise
databases
computer vision
image processing
level set
compression ratio
testing process