Terahertz imaging with GaAs and GaN plasma field effect transistors detectors.
Wojciech KnapDmytro B. ButNina DyakonovaDominique CoquillatFrederic TeppeJaroslaw SuszekAgnieszka M. SiemionMaciej SypekKrzesimir SzkudlarekGrzegorz CywinskiIvan YahniukPublished in: MIXDES (2016)
Keyphrases
- field effect transistors
- high density
- schottky barrier
- steady state
- thin film
- semiconductor devices
- mathematical analysis
- image analysis
- imaging systems
- high resolution
- image processing
- object detection
- data center
- medical imaging
- chemical vapor deposition
- structuring elements
- clinical applications
- data acquisition
- acquired images
- light intensity
- computer vision
- database
- infrared
- markov chain
- atomic force microscopy