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Automatic Test Configuration and Pattern Generation (ATCPG) for Neuromorphic Chips.
I-Wei Chiu
Xin-Ping Chen
Jennifer Shueh-Inn Hu
James Chien-Mo Li
Published in:
ICCAD (2022)
Keyphrases
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pattern generation
high speed
semi automatic
data driven
machine learning
computer systems
real world
test cases
test data
fully automatic
statistical tests
integrated circuit