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Automatic Test Configuration and Pattern Generation (ATCPG) for Neuromorphic Chips.

I-Wei ChiuXin-Ping ChenJennifer Shueh-Inn HuJames Chien-Mo Li
Published in: ICCAD (2022)
Keyphrases
  • pattern generation
  • high speed
  • semi automatic
  • data driven
  • machine learning
  • computer systems
  • real world
  • test cases
  • test data
  • fully automatic
  • statistical tests
  • integrated circuit