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Wideband Surface Impedance Measurements in Superconducting Films.
Enrico Silva
Nicola Pompeo
Kostiantyn Torokhtii
Stefano Sarti
Published in:
IEEE Trans. Instrum. Meas. (2016)
Keyphrases
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surface temperature
multiview reconstruction
surface roughness
image measurements
three dimensional
film thickness
space charge
magnetic field
d objects
silicon dioxide
grain size
object surface
surface reconstruction
physical models
optical properties
high temperature
refractive index
range data