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Simultaneous Measurement of Thickness and Group Refractive Index Based on Differential White Light Interferometry.
Xu Lu
Xinkai Wang
Yunlong Zhu
Yonggui Yuan
Fanyang Dang
Yao Zhu
Zhangjun Yu
Jun Yang
Published in:
IEEE Trans. Instrum. Meas. (2023)
Keyphrases
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film thickness
white light interferometry
refractive index
thin film
surface normals
single view
electrical properties
photometric stereo
room temperature
zenith angle
viewpoint
multiscale
light source
shape from shading