Texture inspection for defects using neural networks and support vector machines.
Ajay KumarHelen C. ShenPublished in: ICIP (3) (2002)
Keyphrases
- defect detection
- neural networks and support vector machines
- automated visual inspection
- feature extraction
- textured surfaces
- automatic inspection
- texture classification
- texture analysis
- data sets
- computer vision
- distance measure
- natural images
- gray level
- computer graphics
- local binary pattern
- printed circuit boards