Test Cycle Count Reduction in a Parallel Scan BIST Environment.

Bechir Ayari Prab Varma

Published in: J. Electron. Test. (2000)

Keyphrases

real time
parallel processing
dynamic environments
artificial intelligence
genetic algorithm
databases
website
mobile robot
general purpose
database
virtual world
test cases
test data
autonomous agents
data sets
indoor environments
autonomous robots
multi core processors
built in self test