On Pattern Recognition and Quality Control.
Paul P. WangPublished in: IEEE Trans. Syst. Man Cybern. (1975)
Keyphrases
- quality control
- pattern recognition
- machine vision
- quality assurance
- automated visual inspection
- image processing
- product quality
- neural network
- image analysis
- manufacturing systems
- pattern analysis
- computer vision
- manufacturing process
- machine learning
- signal processing
- support vector machine svm
- feature extraction
- oil field
- fuzzy sets
- dimensionality reduction
- pattern classification
- graph matching
- vision system
- moment invariants
- quality improvement
- face recognition