Test quality of hierarchical defect-tolerant integrated circuits.

Claude Thibeault Yvon Savaria Jean-Louis Houle

Published in: J. Electron. Test. (1992)

Keyphrases

integrated circuit
built in self test
high quality
higher quality
information retrieval
test data
printed circuit boards
software testing
quality measures
statistical tests
hierarchical structure
data sets
test cases
low cost
multiscale
artificial intelligence
data mining