Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory.

H. Takahashi Y. Okamoto Toshiki Hamada Y. Komura S. Watanabe K. Tsuda H. Sawai Takanori Matsuzaki Yoshinori Ando Tatsuya Onuki H. Kunitake Shunpei Yamazaki D. Kobayashi A. Ikuta Takahiro Makino Takeshi Ohshima

Published in: IRPS (2023)

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