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A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design.
Hsiang-Huang Wu
Jih-Nung Lee
Ming-Cheng Chiang
Po-Wei Liu
Chi-Feng Wu
Published in:
ITC (2009)
Keyphrases
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detection algorithm
similarity measure
learning algorithm
preprocessing
k means
test suite
cost function
dynamic programming
probabilistic model
built in self test
recognition algorithm
test cases
expectation maximization
particle swarm optimization
high speed
worst case
search space
bayesian networks