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A Layout-Aware Test Methodology for Silicon Interposer in System-in-a-Package.
Katherine Shu-Min Li
Cheng-You Ho
Ruei-Ting Gu
Sying-Jyan Wang
Yingchieh Ho
Jiun-Jie Huang
Bo-Chuan Cheng
An-Ting Liu
Published in:
Asian Test Symposium (2013)
Keyphrases
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high speed
test cases
low cost
database
real time
neural network
social networks
decision trees
three dimensional
x ray
test data
design methodology
test suite
software package