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Device and Circuit Design Challenges in the Digital Subthreshold Region for Ultralow-Power Applications.
Ramesh Vaddi
Sudeb Dasgupta
R. P. Agarwal
Published in:
VLSI Design (2009)
Keyphrases
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circuit design
design automation
lessons learned
digital circuits
power consumption
open issues
key issues
field effect transistors
low cost
real world
input image
infrared
image regions
data acquisition