Automatic SoC Level Test Path Synthesis Based on Partial Functional Models.
Anton TsertovRaimund UbarArtur JutmanSergei DevadzePublished in: Asian Test Symposium (2011)
Keyphrases
- higher level
- levels of abstraction
- semi automatic
- databases
- test cases
- data driven
- multiscale
- decision trees
- search engine
- dynamic environments
- real time
- statistical significance
- lower level
- hardware and software
- embedded systems
- fully automatic
- data mining
- machine learning
- face recognition
- low cost
- search space
- artificial neural networks
- data structure
- image sequences