Reliability analysis of analog circuits using quadratic lifetime worst-case distance prediction.
Xin PanHelmut GraebPublished in: CICC (2010)
Keyphrases
- reliability analysis
- analog circuits
- worst case
- fault diagnosis
- digital circuits
- upper bound
- computational complexity
- prediction model
- survival analysis
- np hard
- neural network
- distance measure
- condition monitoring
- distance function
- lower bound
- decision support system
- predictive modeling
- high speed
- relational databases
- knowledge base
- decision making