Direct connection and testing of TSV and microbump devices using NanoPierce™ contactor for 3D-IC integration.

Onnik Yaglioglu Ben Eldridge

Published in: VTS (2012)

Keyphrases

test cases
testing process
integration testing
test suite
test generation
test data
test set
mobile devices
neural network
expert systems
evolutionary algorithm
multi agent
software systems
data fusion
information integration
genetic algorithm
data sets