Practical Aspects of Delay Testing for Nanometer Chips.

Vivek Chickermane Brion L. Keller Kevin McCauley Anis Uzzaman

Published in: Asian Test Symposium (2005)

Keyphrases

high speed
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real world
neural network
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test cases
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hidden markov models
evolutionary algorithm
mobile devices
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expert systems
three dimensional
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image processing
artificial intelligence