Login / Signup

Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation.

Kiyoteru HayamaKenichiro TakakuraK. ShigakiHidenori OhyamaJoan Marc RafíAbdelkarim MerchaEddy SimoenCor Claeys
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • electron beam
  • nano scale
  • machine learning
  • electron microscopy
  • database
  • data sets
  • neural network
  • artificial intelligence
  • decision trees
  • high impact