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Investigation of Mean-Error Metrics for Testing Approximate Integrated Circuits.

Marcello TraiolaArnaud VirazelPatrick GirardMario BarbareschiAlberto Bosio
Published in: DFT (2018)
Keyphrases
  • integrated circuit
  • error metrics
  • wavelet synopses
  • error measure
  • maximum error
  • electron beam
  • ground truth
  • error bounds
  • relative error
  • printed circuit boards