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Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope.
Shuai Liang
Mokrane Boudaoud
Catherine Achard
Weibin Rong
Stéphane Régnier
Published in:
IROS (2019)
Keyphrases
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deep learning
electron microscope
guide wire
x ray
unsupervised learning
unsupervised feature learning
computer vision
machine learning
object tracking
particle filter
visual tracking
mean shift
particle filtering
mental models
three dimensional
image processing
appearance model
partial occlusion