Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data.
Dong XiangZhen ChenPublished in: Asian Test Symposium (2011)
Keyphrases
- test data
- low power
- test cases
- power consumption
- low cost
- high speed
- test set
- testing process
- wireless transmission
- high power
- training data
- digital signal processing
- logic circuits
- single chip
- training set
- test generation
- training and test data
- search based testing
- mixed signal
- image sensor
- vlsi circuits
- vlsi architecture
- low power consumption
- data sets
- ultra low power
- feature space
- test data generation
- cmos technology
- software testing
- power reduction
- test suite
- image compression
- object oriented
- computer vision